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 PCA2003
32 kHz watch circuit with programmable adaptive motor pulse and pulse period
Rev. 02 -- 21 July 2009 Product data sheet
1. General description
The PCA2003 is a CMOS integrated circuit for battery operated wrist watches with a 32 kHz quartz crystal as timing element and a bipolar 1 Hz stepping motor. The quartz crystal oscillator and the frequency divider are optimized for minimum power consumption. A timing accuracy of 1 ppm is achieved with a programmable, digital frequency adjustment. To obtain the minimum overall power consumption for the watch, an automatic motor pulse adaptation function is provided. The circuit supplies only the minimum drive current, which is necessary to ensure a correct motor step. Changing the drive current of the motor is achieved by chopping the motor pulse with a variable duty cycle. The pulse period and the range of the variable duty cycle can be programmed to suit different types of motors. The automatic pulse adaptation scheme is based on a safe dynamic detection of successful motor steps. A pad RESET is provided (used for stopping the motor) for accurate time setting and for accelerated testing of the watch.
2. Features
I Amplitude-regulated 32 kHz quartz crystal oscillator, with excellent frequency stability and high immunity to leakage currents I Electrically programmable time calibration with 1 ppm resolution stored in One Time Programmable (OTP) memory I The quartz crystal is the only external component connected I Very low supply current, typical 90 nA I One second output pulses for bipolar stepping motor I Five different programmable output periods (1 s to 30 s) I Minimum power consumption for the entire watch, due to self adaptation of the motor drive according to the required torque I Reliable step detection circuit I Motor pulse width, pulse modulation, and pulse adaptation range programmable in a wide range, stored in OTP memory I Stop function for accurate time setting and power saving during shelf life I Test mode for accelerated testing of the mechanical parts of the watch and the IC I Test bits for type recognition
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
3. Applications
I Driver circuits for bipolar stepping motors I High immunity motor drive circuits
4. Ordering information
Table 1. Ordering information Package Name PCA2003U/10AA/1 PCA2003U/10AC/1
[1] [2]
Type number[1]
Description wire bond die; 8 bonding pads; 1.16 x 0.86 x 0.22 mm[2] wire bond die; 8 bonding pads; 1.16 x 0.86 x 0.22 mm[2]
Version PCA200xU PCA200xU
PCA200xU PCA200xU
Version AC: enhanced oscillator performance; to be used for new designs. Packing method: bare die; chip on film frame carrier.
5. Block diagram
8 kHz OSCIN OSCOUT 3 4 OSCILLATOR
32 Hz DIVIDER RESET 8 RESET
/4
TIMING ADJUSTMENT, INHIBITION 5 1 VOLTAGE DETECTOR, OTP-CONTROLLER OTP-MEMORY 1 Hz
reset
VDD VSS
MOTOR CONTROL WITH ADAPTIVE PULSE MODULATION
i.c.
2
PCA2003
STEP DETECTION
6
7
MOT1
MOT2
001aai168
Fig 1.
Block diagram
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
2 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
6. Pinning information
6.1 Pinning
PCA200xU
VSS i.c. 1 2 x 0 OSCIN OSCOUT 3 4 0 y 6 5
001aai177
8 7
RESET MOT2
MOT1 VDD
Top view. For mechanical details, see Figure 13.
Fig 2.
Pad configuration of PCA2003
6.2 Pin description
Table 2. Symbol VSS i.c. OSCIN OSCOUT VDD MOT1 MOT2 RESET Pin description Pin 1 2 3 4 5 6 7 8 Description ground internally connected oscillator input oscillator output supply voltage motor 1 output motor 2 output reset input
7. Functional description
7.1 Motor pulse
The motor output supplies pulses of different driving stages, depending on the torque required to turn on the motor. The number of different stages can be selected between three and six. With the exception of the highest driving stage, each motor pulse (tp in Figure 3 and Figure 6) is followed by a detection phase during which the motor movement is monitored, in order to check whether the motor has turned correctly or not.
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
3 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
1.96 ms tp detection phase tp 2t p
mgw350
0.98 ms 31.25 ms 31.25 ms
Fig 3.
Correction sequence after failed motor step
If a missing step is detected, a correction sequence is generated (see Figure 3) and the driving stage is switched to the next level. The correction sequence consists of two pulses: first a short pulse in the opposite direction (0.98 ms, modulated with the maximum duty cycle) to give the motor a defined position, followed by a motor pulse of the strongest driving level. Every 4 minutes, the driving level is lowered again by one stage. The motor pulse has a constant pulse width. The driving level is regulated by chopping the driving pulse with a variable duty cycle. The driving level starts from the programmed minimum value and increases by 6.25 % after each failed motor step. The strongest driving stage, which is not followed by a detection phase, is programmed separately. Therefore, it is possible to program a larger energy gap between the pulses with step detection and the strongest, not monitored, pulse. This might be necessary to ensure a reliable and stable operation under adverse conditions (magnetic fields and vibrations). If the watch works in the highest driving stage, the driving level jumps after the 4-minute period directly to the lowest stage, and not just one stage lower. To optimize the performance for different motors, the following parameters can be programmed:
* * * * *
Pulse width: 0.98 ms to 7.8 ms in steps of 0.98 ms Duty cycle of lowest driving level: 37.5 % to 56.25 % in steps of 6.25 % Number of driving levels (including the highest driving level): 3 to 6 Duty cycle of the highest driving level: 75 % or 100 % Enlargement pulse for the highest driving level: on or off
The enlargement pulse has a duty cycle of 25 % and a pulse width which is twice the programmed motor pulse width. The repetition period for the chopping pattern is 0.98 ms. Figure 4 shows an example of a 3.9 ms pulse.
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
4 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
DUTY CYCLE 37.5 %
0.244 ms
0.122 ms
43.75 %
50 %
56.25 %
62.5 %
68.75 %
75 %
81.25 %
100 % 0.98 ms 0.98 ms 0.98 ms 0.98 ms
mgw351
Fig 4.
Possible modulations for a 3.9 ms motor pulse
7.2 Step detection
Figure 5 shows a simplified diagram of the motor driving and step detection circuit, and Figure 6 shows the step detection sequence and corresponding sampling current. Between the motor driving pulses, the switches P1 and P2 are closed, which means the motor is short-circuited. For a pulse in one direction, P1 and N2 are open, and P2 and N1 are closed with the appropriate duty cycle; for a pulse in the opposite direction, P2 and N1 are open, and P1 and N2 closed.
VDD RD D1
P1
P3 MOTOR MOT1
P4
P2
MOT2 N2
N1 VSS
mgw352
Fig 5.
Simplified diagram of motor driving and step detection circuit
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
5 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
The step detection phase is initiated after the motor driving pulse. In phase 1 P1 and P2 are first closed for 0.98 ms and then in phase 2 all four drive switches (P1, N1, P2 and N2) are opened for 0.98 ms. As a result, the energy stored in the motor inductance is reduced as fast as possible. The induced current caused by the residual motor movement is then sampled in phase 3 (closing P3 and P2) and in phase 4 (closing P1 and P4). For step detection in the opposite direction P1 and P4 are closed during phase 3 and P2 and P3 during phase 4 (see Figure 6).
phase 1
phase 2
phase 3
phase 4
I motor
positive detection level t negative detection level
tp 0.98 ms (motor shorted) sampling voltage t d = 0.98 ms programmable time limit OTP C4 to C6
sampling t
sampling voltage sampling results
positive detection
negative detection
t motor shorted sampling 61 s 0.49 ms
mgw569
Fig 6.
Step detection sequence and corresponding sampling voltage
The condition for a successful motor step is a positive step detection pulse (current in the same direction as in the driving phase) followed by a negative detection pulse within a given time limit. This time limit can be programmed between 3.9 ms and 10.7 ms (in steps of 0.98 ms) in order to ensure a safe and correct step detection under all conditions (for instance magnetic fields). The step detection phase stops after the last 31.25 ms, after the start of the motor driving pulse.
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
6 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
7.3 Time calibration
The quartz crystal oscillator has an integrated capacitance of 5.2 pF, which is lower than the specified capacitance (CL) of 8.2 pF for the quartz crystal (see Table 10). Therefore, the oscillator frequency is typically 60 ppm higher than 32.768 kHz. This positive frequency offset is compensated by removing the appropriate number of 8192 Hz pulses in the divider chain (maximum 127 pulses), every 1 or 2 minutes. The time correction is given in Table 3.
Table 3. Time calibration Correction per step (n = 1) ppm 2.03 1.017 0.176 0.088 Correction per step (n = 127) Seconds per day 22.3 11.15 258 129 Seconds per day ppm
Calibration period 1 minute 2 minutes
After measuring the effective oscillator frequency, the number of correction pulses must be calculated and stored together with the calibration period in the OTP memory (see Section 7.7). The oscillator frequency can be measured at pad RESET, where a square wave signal with the frequency of ----------- x f osc is provided. This frequency shows a jitter every minute or every two minutes, which originates from the time calibration, depending on the programmed calibration period. Details on how to measure the oscillator frequency and the programmed inhibition time are given in Section 7.10.
1 1024
7.4 Reset
At pad RESET an output signal with a frequency of ----------- x f osc = 32 Hz is provided. Connecting pad RESET to VDD stops the motor drive and opens all four (P1, N1, P2 and N2) driver switches (see Figure 5). Connecting pad RESET to VSS activates the test mode. In this mode the motor output frequency is 32 Hz, which can be used to test the mechanical function of the watch. After releasing the pad RESET, the motor starts exactly one second later with the smallest duty cycle and with the opposite polarity to the last pulse before stopping. The debounce time for the RESET function is between 31 ms and 62 ms.
1 1024
7.5 Programming possibilities
The programming data is stored in OTP cells (EPROM cells). At delivery, all memory cells are in state 0. The cells can be programmed to the state 1, but then there is no more set back to state 0. The programming data is organized in an array of four 8-bit words: word A contains the time calibration, words B and C contain the setting for the monitor pulses and word D contains the type recognition (see Table 4).
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
7 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
Table 4. Word A B 1
Words and bits Bit 2 3 4 5 6 7 8 calibration period highest stage: duty cycle pulse stretching output period number of 8192 Hz pulses to be removed lowest stage: duty cycle number of driving stages
C D
pulse width type Table 5. Bit Inhibition time 1 to 7 Calibration period 8 0 1 Table 6. Bit 1 to 2 -
maximum time delay between positive and negative detection pulses factory test bits Description of word A bits Value Description
output period
factory test bit
adjust the number of the 8192 Hz pulses to be removed; bit 1 is the MSB and bit 7 is the LSB 1 minute 2 minutes
Description of word B bits Value 00 01 10 11 Description 37.5 % 43.75 % 50 % 56.25 % 3 4 5 6[1] 75 %[2] 100 % no pulse stretching pulse of 2 x tp and duty cycle of 25 % are added
Duty cycle lowest driving stage
Number of driving stages 3 to 4 00 01 10 11 Duty cycle highest driving stage 5 Pulse stretching 6 0 1 0 1
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
8 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
Description of word B bits ...continued Value 00 01 10 11 Description 1s 5s 10 s 20 s
Table 6. Bit
Output period 7 to 8
[1] [2]
Including the highest driving stage, which one has no motor step detection. If the maximum duty cycle of 75 % is selected, not all programming combinations are possible since the second highest level must be smaller than the highest driving level.
Table 7. Bit
Description of word C bits Value 000 001 010 011 100 101 110 111 Description 0.98 ms 1.95 ms 2.90 ms 3.90 ms 4.90 ms 5.90 ms 6.80 ms 7.80 ms 3.91 ms 4.88 ms 5.86 ms 6.84 ms 7.81 ms 8.79 ms 9.77 ms 10.74 ms bit 7 and 8 of word B active 30 s, bit 7 and 8 of word B inactive -
Pulse width tp 1 to 3
Time delay td(max) 4 to 6
[1]
000 001 010 011 100 101 110 111
Output period 7 Factory test bit 8
[1]
0 1 -
Between positive and negative detection pulses.
Byte D is read to determine which type of the PCA200x family is used in a particular application.
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
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NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
Description of word D bits Value 0000 1000 0100 1100 Description PCA2002 PCA2000 PCA2001 PCA2003 -
Table 8. Bit
Type recognition 1 to 4
Factory test bits 5 to 8 -
7.6 Programming procedure
For a watch it is essential that the timing calibration can be made after the watch is fully assembled. In this situation, the supply pads are often the only terminals which are still accessible. Writing to the OTP cells and performing the related functional checks is achieved in the PCA2003 by modulating the supply voltage. The necessary control circuit consists basically of a voltage level detector, an instruction counter which determines the function to be performed, and an 8-bit shift register which allows writing to the OTP cells of an 8-bit word in one step and acts as a data pointer for checking the OTP content. There are six different instruction states (state 3 and state 5 are handled as state 4):
* * * * * *
State 1: measurement of the quartz crystal oscillator frequency (divided by 1024) State 2: measurement of the inhibition time State 3: write/check word A State 4: write/check word B State 5: write/check word C State 6: check word D (type recognition)
Each instruction state is switched on with a pulse to VP(prog)(start). After this large pulse, an initial waiting time of t0 is required. The programming instructions are then entered by modulating the supply voltage with small pulses (amplitude VP(mod) and pulse width tmod). The first small pulse defines the start time, the following pulses perform three different functions, depending on the time delay (td) from the preceding pulse (see Figure 7, Figure 8, Figure 11 and Figure 12):
* td = t1 (0.7 ms); increments the instruction counter * td = t2 (1.7 ms); clocks the shift register with data = logic 0 * td = t3 (2.7 ms); clocks the shift register with data = logic 1
The programming procedure requires a stable oscillator. This means that a waiting time, determined by the start-up time of the oscillator is necessary after power-on of the circuit. After the VP(prog)(start) pulse, the instruction counter is in state 1 and the data shift register is cleared. The instruction state ends with a second pulse to VP(prog)(stop) or with a pulse to Vstore.
PCA2003_2 (c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
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NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
In any case, the instruction states are terminated automatically 2 seconds after the last supply modulation pulse.
7.7 Programming the memory cells
Applying the two-stage programming pulse (see Figure 7) transfers the stored data in the shift register to the OTP cells. Perform the following to program a memory word: 1. Starting with a VP(prog)(start) pulse wait for the time period t0 then set the instruction counter to the word to be written (td = t1). 2. Enter the data to be stored in the shift register (td = t2 or t3). LSB first (bit 8) and the MSB last (bit 1). 3. Applying the two-stage programming pulse Vprestore followed by Vstore stores the word. The delay between the last data bit and the prestore pulse Vprestore is td = t4. Store the word by raising the supply voltage to Vstore; the delay between the last data bit and the store pulse is td. The example shown in Figure 7 performs the following functions:
* * * *
Start Setting instruction counter to state 4 (word B) Entering data word 110101 into the shift register (sequence: LSB first and MSB last) Writing to the OTP cells for word B
tw(prestore)
VDD
Vstore
tp(start)
VP(prog)(start) Vprestore
t0
VP(mod) VDD(nom) VSS
t1 t1 t1
t3
t2
t3
t2
t3
t3
t4
tw(store)
mgw356
VDD(nom): nominal supply voltage. The example shows the programming of B = 110101 (the sequence is MSB first and LSB last).
Fig 7.
Supply voltage modulation for programming
PCA2003_2
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Product data sheet
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NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
7.8 Checking memory content
The stored data of the OTP array can be checked bit wise by measuring the supply current. The array word is selected by the instruction state and the bit is addressed by the shift register. To read a word, the word is first selected (td = t1), and a logic 1 is written into the first cell of the shift register (td = t3). This logic 1 is then shifted through the entire shift register (td = t2), so that it points with each clock pulse to the next bit. If the addressed OTP cell contains a logic 1, a 30 k resistor is connected between VDD and VSS, which increases the supply current accordingly. Figure 8 shows the supply voltage modulation for reading word B, with the corresponding supply current variation for word B = 110101 (sequence: first MSB and last LSB).
VDD tp(start) VP(prog)(start) t0 VP(mod) VDD(nom) VSS t1 t1 t1 t3 t2 t2 t2 VP(prog)(stop) t2 t2 tp(stop)
IDD
(1)
mgw357
VDD(nom): nominal supply voltage. (1)
V DD I DD = --------------30 k Supply voltage modulation and corresponding supply current variation for reading word B
Fig 8.
PCA2003_2
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Product data sheet
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NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
7.9 Frequency tuning of assembled watch
Figure 9 shows the test set-up for frequency tuning the assembled watch.
32 kHz
M FREQUENCY COUNTER PCA200x motor
PROGRAMMABLE DC POWER SUPPLY PC INTERFACE
battery
PC
mgw568
Fig 9.
Frequency tuning the assembled watch
7.10 Measurement of oscillator frequency and inhibition time
The output of the two measuring states can either be monitored directly at pad RESET or as a modulation of the supply voltage (a modulating resistor of 30 k is connected between VDD and VSS when the signal at pad RESET is at HIGH-level). The supply voltage modulation must be followed as shown in Figure 10 in order to guarantee the correct start-up of the circuit during production and testing.
VDD
tp(stop) VP(prog)(stop) td(start) > 500 ms
VDD(nom) VSS
001aac503
VDD(nom): nominal supply voltage.
Fig 10. Supply voltage at start-up during production and testing
Measuring states:
PCA2003_2
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Product data sheet
Rev. 02 -- 21 July 2009
13 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
* State 1: quartz crystal oscillator frequency divided by 1024; state 1 starts with a pulse
to VP and ends with a second pulse to VP
* State 2: inhibition time has a value of n x 0.122 ms. A signal with periodicity of
31.25 ms + n x 0.122 ms appears at pad RESET and as current modulation at pad VDD (see Figure 11 and Figure 12)
31.25 ms + inhibition time VDD
VO(dif)
VSS
mgw355
Fig 11. Output waveform at pad RESET for instruction state 2
VDD
t p(start) VP(prog)(stop) t0 t1
t p(stop)
VP(prog)(start)
VP(mod) VDD(nom) VSS
mgu719
VDD(nom): nominal supply voltage.
Fig 12. Supply voltage modulation for starting and stopping of instruction state 2
7.11 Customer testing
Connecting pad RESET to VSS activates the test mode. In this test mode, the motor output frequency is 8 Hz; the duty cycle reduction and battery check occurs every second, instead of every 4 minutes.
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
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NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
8. Limiting values
Table 9. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol VDD VI tsc Tamb VESD Ilu Tstg
[1] [2] [3] [4] [5] [6]
Parameter supply voltage input voltage short circuit duration time ambient temperature electrostatic discharge voltage latch-up current storage temperature
Conditions VSS = 0 V on all supply pins output HBM MM
[3] [4] [5] [6] [1][2]
Min -1.8 -0.5 -10 -30
Max +7.0 +7.5 indefinite +60 2000 200 100 +100
Unit V V s C V V mA C
When writing to the OTP cells, the supply voltage (VDD) can be raised to a maximum of 12 V for a time period of 1 s. Connecting the battery with reversed polarity does not destroy the circuit, but in this condition a large current flows, which rapidly discharges the battery. Pass level; Human Body Model (HBM) according to JESD22-A114. Pass level; Machine Model (MM), according to JESD22-A115. Pass level; Latch-up testing, according to JESD78. According to the NXP store and transport conditions (document SNW-SQ-623) the devices have to be stored at a temperature of +5 C to +45 C and a humidity of 25 % to 75 %.
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
15 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
9. Characteristics
Table 10. Characteristics VDD = 1.55 V; VSS = 0 V; fosc = 32.768 kHz; Tamb = 25 C; quartz crystal: RS = 40 k, C1 = 2 fF to 3 fF, CL = 8.2 pF; unless otherwise specified. Symbol Supply VDD VDD IDD supply voltage normal operating mode; Tamb = -10 C to +60 C between motor pulses between motor pulses at VDD = 3.5 V Tamb = -10 C to +60 C stop mode; pad RESET connected to VDD Motor output Vsat Zo(sc) Oscillator Vstart gm tstartup f/f CL(itg) Rpar Pad RESET fo VO(dif) tr tf Ii(AV) output frequency differential output voltage rise time fall time average input current RL = 1 M; CL = 10 pF RL = 1 M; CL = 10 pF RL = 1 M; CL = 10 pF pad RESET connected to VDD or VSS
[2]
Parameter
Conditions
Min 1.1 -
Typ 1.55 90 120 100
Max 3.60 0.25 120 180 200 135
Unit V V nA nA nA nA
supply voltage variation V/t = 1 V/s supply current
saturation voltage output impedance (short circuit) start voltage transconductance start-up time frequency stability integrated load capacitance parasitic resistance
Rmotor = 2 k; Tamb = -10 C to +60 C between motor pulses; Imotor < 1 mA
[1]
-
150 200
200 300
mV
1.1 Vi(osc) 50 mV (p-p) VDD = 100 mV 5 4.3 allowed resistance between adjacent pads 20
10 0.3 0.05 5.2 -
0.9 0.20 6.3 -
V S s ppm pF M
1.4 -
32 1 1 10
20
Hz V s s nA
[2] [2]
[1] [2]
P1 + ... + P4 + N1 + N2 (see Section 7.2). RL and CL are a load resistor and load capacitor, externally connected to pad RESET.
PCA2003_2
(c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
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NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
10. OTP programming characteristics
Table 11. Specifications for OTP programming See Figure 7, Figure 8 and Figure 12. Symbol VDD VP(prog)(start) VP(prog)(stop) VP(mod) Vprestore Vstore Istore tp(start) tp(stop) tmod tw(prestore) tw(store) t0 t1 t2 t3 t4 SR Rmod Parameter[1] supply voltage programming supply voltage (start) programming supply voltage (stop) supply voltage modulation prestore voltage store voltage store current start pulse width pulse width of stop pulse modulation pulse width prestore pulse width store pulse width time 0 time 1 time 2 time 3 time 4 slew rate modulation resistance for writing to the OTP cells waiting time after start pulse pulse distance for incrementing the state counter pulse distance for clocking the data register with data = logic 0 pulse distance for clocking the data register with data = logic 1 waiting time for writing to OTP cells for modulation of the supply voltage supply current modulation read-out resistor for entering instructions for prestore pulse for writing to the OTP cells for writing to the OTP cells Conditions during programming procedure Min 1.5 6.6 6.2 320 6.2 9.9 8 0.05 25 0.05 95 20 0.6 1.6 2.6 0.1 0.5 18 Typ 350 10.0 10 30 100 0.7 1.7 2.7 0.2 30 Max 3.0 6.8 6.4 380 6.4 10.1 10 12 0.5 40 0.5 110 30 0.8 1.8 2.8 0.3 5.0 45 Unit V V V mV V V mA ms ms s ms ms ms ms ms ms ms V/s k
[1]
Program each word once only.
PCA2003_2
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Product data sheet
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NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
11. Bare die outline
Wire bond die; 8 bonding pads; 1.16 x 0.86 x 0.22 mm
D A P1 P2 e1 e2 E
PCA200xU
P4
P3
detail X X eD DIMENSIONS (mm are the original dimensions) UNIT mm max nom min A 0.22 0.20 0.18 D 1.16 E 0.86 e1 0.17 e2 0.32 eD 0.96 P1 P2 P3 P4 0 0.5 scale EUROPEAN PROJECTION ISSUE DATE 08-05-09 08-05-21 1 mm
0.099 0.089 0.099 0.089 0.096 0.086 0.096 0.086 0.093 0.083 0.093 0.083
OUTLINE VERSION PCA200xU
REFERENCES IEC JEDEC JEITA
Fig 13. Bare die outline PCA2003U Table 12. Symbol VSS
[2]
Bonding pad locations Pad 1 2 3 4 5 6 7 8 Coordinates[1] x -480 -480 -480 -480 +480 +480 +480 +480 y +330 +160 -160 -330 -330 -160 +160 +330
i.c.[3] OSCIN OSCOUT VDD MOT1 MOT2 RESET
[1] [2] [3]
All coordinates are referenced, in m, to the center of the die (see Figure 13). The substrate (rear side of the chip) is connected to VSS. Therefore the die pad must be either floating or connected to VSS. Pad i.c. is used for factory tests; in normal operation it should be left open-circuit, and it has an internal pull-down resistance to VSS.
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Product data sheet
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NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
12. Abbreviations
Table 13. Acronym CMOS HBM LSB MM MSB OTP Abbreviations Description Complementary Metal Oxide Semiconductor Human Body Model Least Significant Bit Machine Model Most Significant Bit One Time Programmable
13. Revision history
Table 14. Revision history Release date 20090721 Data sheet status Product data sheet Product data sheet Change notice Supersedes PCA2003_1 Document ID PCA2003_2 Modifications: PCA2003_1
*
Amended new product type
20081215
PCA2003_2
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Product data sheet
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PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
14. Legal information
14.1 Data sheet status
Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet
[1] [2] [3]
Product status[3] Development Qualification Production
Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification.
Please consult the most recently issued document before initiating or completing a design. The term `short data sheet' is explained in section "Definitions". The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
14.2 Definitions
Draft -- The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet -- A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.
Limiting values -- Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale -- NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license -- Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control -- This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. Bare die -- All die are tested on compliance with their related technical specifications as stated in this data sheet up to the point of wafer sawing and are handled in accordance with the NXP Semiconductors storage and transportation conditions. If there are data sheet limits not guaranteed, these will be separately indicated in the data sheet. There are no post-packing tests performed on individual die or wafers. NXP Semiconductors has no control of third party procedures in the sawing, handling, packing or assembly of the die. Accordingly, NXP Semiconductors assumes no liability for device functionality or performance of the die or systems after third party sawing, handling, packing or assembly of the die. It is the responsibility of the customer to test and qualify their application in which the die is used. All die sales are conditioned upon and subject to the customer entering into a written die sale agreement with NXP Semiconductors through its legal department.
14.3 Disclaimers
General -- Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes -- NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use -- NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk. Applications -- Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
14.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners.
15. Contact information
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com
PCA2003_2 (c) NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 02 -- 21 July 2009
20 of 21
NXP Semiconductors
PCA2003
32 kHz watch circuit with programmable adaptive motor pulse
16. Contents
1 2 3 4 5 6 6.1 6.2 7 7.1 7.2 7.3 7.4 7.5 7.6 7.7 7.8 7.9 7.10 7.11 8 9 10 11 12 13 14 14.1 14.2 14.3 14.4 15 16 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 Functional description . . . . . . . . . . . . . . . . . . . 3 Motor pulse . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Step detection. . . . . . . . . . . . . . . . . . . . . . . . . . 5 Time calibration . . . . . . . . . . . . . . . . . . . . . . . . 7 Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Programming possibilities. . . . . . . . . . . . . . . . . 7 Programming procedure . . . . . . . . . . . . . . . . . 10 Programming the memory cells . . . . . . . . . . . 11 Checking memory content . . . . . . . . . . . . . . . 12 Frequency tuning of assembled watch . . . . . . 13 Measurement of oscillator frequency and inhibition time . . . . . . . . . . . . . . . . . . . . . . . . . 13 Customer testing. . . . . . . . . . . . . . . . . . . . . . . 14 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . 15 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . 16 OTP programming characteristics . . . . . . . . . 17 Bare die outline . . . . . . . . . . . . . . . . . . . . . . . . 18 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 19 Legal information. . . . . . . . . . . . . . . . . . . . . . . 20 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 20 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Contact information. . . . . . . . . . . . . . . . . . . . . 20 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section `Legal information'.
(c) NXP B.V. 2009.
All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 21 July 2009 Document identifier: PCA2003_2


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